Testable  Design and  Testing of Analogue & 

Mixed -Signal VLSI Systems  

 


 

(A three-days modular course)

 

Introduction

           

 

 

Fault modelling

          

 

 

Test generation and fault simulation

            

 

 

Testability Analysis and Design-for-Test (DfT) Approaches

          

 

 

Testable Design & Test of Stand-Alone Analogue Chips & Embedded Cores

           

 

 

Built-In Self-Test of Analogue Macros

          

 

 

RF Testing of Analogue Cores

          

 

 

Analogue System Testing 

          

 

         Click for a slide  example of the  PowerPoint   presentation of the course analogue & mixed-signal testable design and testing

AnaTslide_1.jpg (236232 bytes)

   The course consists of 8 modules.  Each module takes between 1 to 3 hours. Also a single or a combination of modules can be provided, depending on the specific requirements. If single modules are requested, basic knowledge on testable design and test is assumed.