Theory and Application of the Mixed-Signal

 Boundary-Scan Standard (IEEE 1149.4)

 


 

Introduction

-         Test requirements in low-physical access systems

-         Scan-based & alternative approaches

-         Impact on chip and PCB design

-         Cost-based choices

-         Examples of industrial test disasters

 

Brief Basics of the Digital Boundary-Scan Standard (IEEE Std. 1149.1)

-         Architecture

-         TAP controller

-         Basic instructions

-         Application examples & products

 

Mixed-Signal Circuits and Associated Testing problems

-         Modern mixed-signal electronics & application areas

-         Specific test issues in analogue & mixed-signal systems

-         Test strategies based on functional behaviour

-         Test strategies based on actual defects

-         Mixed-signal Design-for-Test strategies

o       Ad-hoc

o       Structural (busses, BIST)

-         Examples of non-BS implementations

 

Details of the Mixed-Signal Boundary-Scan Standard (IEEE Std. 1149.4)

-         Architecture

-         ATAP controller

-         Test Bus Interface

-         Analogue Boundary-Scan Modules

-         Chip Implementations & electrical characteristics

-         Limitations of the standard

 

Instructions in the Mixed-Signal Boundary-Scan Standard

-         Detailed explanation of the complete instruction set

-         Examples using the specific instructions. Includes measurement schemes.

-         Additional options & examples

 

Introduction of the IEEE Std. 1149.4 in Electronical Products

-         What history showed in introducing scan and IEEE Std. 1149.1

-         Cost calculations and quality improvement

-         Impact on design, manufacturing and maintenance

-         Examples of successes and failures in products

-         The role of the mixed-signal standard in the future